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Summary:
Beamline 12.2.2 at the Advanced Light Source is a synchrotron X-ray diffraction beamline for samples at non ambient conditions of pressure, temperature and atmospheric conditions. The information in this page is provided for reference only. All information contained in this document is believed to be correct and very helpful for the user operations. The content involves all details and steps of the methodology, including hardware, software and case studies. The information in this document are subject to change without notice to users.
Supported by:
What to include in your Acknowledgements section:
U.S. Department of Energy- The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.
COMPRES - Beamline 12.2.2 is partially supported by COMPRES, the Consortium for Materials Properties Research in Earth Sciences under NSF Cooperative Agreement EAR 1606856.
Contact:
Listed with expertise of each team member
Andrew Doran| Principle beamline scientist | |
| Bora Kalkan | (510) |
| 486 6548 | bkalkan@lbl.gov |
| COMPRES beamline scientist | |
| Kat Armstrong | (510) |
| 495-2055 | karmstrong@lbl.gov |
Bora Kalkan (510) 605-0611 bkalkan@lbl.gov
Beamline 12.2.2 (510) 495 2055
HP lab 6-2241| COMPRES beamline scientist | |||
| Quentin Williams | (831) 459-3132 | qwilliams@es.ucsc.edu | COMPRES PI |
Other facilities
| Room | Phone |
|---|---|
| High Pressure Laboratory 6-2241 | (510) 486 6987 |
| ALS Control Room | (510) 486 7700 |
| Beamline 12.2.2 | (510) 495 2055 |
Current Schedule:
ALS Beamline operating schedule
Experiments at BL12.2.2
The beamline offers many different areas of expertise:
Room temperature & High/Ambient Pressure
- Axial diffraction through diamond anvil cells
- Radial diffraction through diamond anvil cells
- Single crystal diffraction at ambient pressure
- High-pressure single crystal diffraction at End-station 1
- High-pressure single crystal diffraction at End-station 2
- X-ray total scattering and pair distribution function analyses
High temperature at Ambient or High Pressure
- X-ray powder diffraction using resistively heated cell
- Axial x-ray powder diffraction using double-sided laser heating
- In-situ X-ray powder diffraction coupled with infrared tube furnace and gas flow mixer
Sample loading, gasket drilling, and gas loading at:
