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Beamline 12.2.2 at the Advanced Light Source is a synchrotron X-ray diffraction beamline for samples at non ambient conditions of pressure, temperature and atmospheric conditions. The information in this document is provided for reference only. All information contained in this document is believed to be correct and very helpful for the user operations. The content involves all details and steps of the methodology, including hardware, software and case studies. The information in this document are subject to change without notice to users.
